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  Conference June 2-3, 2010  
  Conferences - Conference June 2-3, 2010
Event Name: Conference
Start Date: Wednesday, June 02, 2010
End Date: Thursday, June 03, 2010
Summary: Increasing Market and Planning Efficiency Through Improved Software and Hardware - Enhanced ISO and RTO unit-commitment models (Washington, DC)(Free webcast available)
Description: The 1 st in a series of 3 conferences.

Enhanced ISO and RTO unit-commitment models. This conference will focus on improving the performance of the day-ahead market and the integration of variable resources, demand resources (DR, DG, and storage) and other technologies by developing unit-commitment models that consider uncertainty and that can accommodate more robust physical and market constraints. Improvements in formulations and solution techniques for unit-commitment will be presented and discussed. Better modeling will be discussed for both new and existing assets. Technology-specific modeling issues and bidding parameters will be discussed for a wide range of resources including wind, solar, demand resources (DR, DG, and storage), electric vehicles, dispatchable transmission, and combined cycle generating stations. Additional topics discussed at this conference will include co-optimization (with respect to energy, reserves, ramp rates, and network topology), settlement calculations, and development of a unit-commitment test bed to benchmark the speed of solution techniques.

This conference will be held at:
    FERC-HQ
    888 First Street, NE
    Washington, DC

Visit our Increasing Market and Planning Efficiency section

A free live webcast is available for this meeting. All webcasts are archived for 3 months.
Title :
* Start Time :
End Time :
Location :
Contact : Eric Krall
Tom Dautel
Contact Telephone : 202-502-6214
202-502-6196
Registration :
Contact Email : Eric.Krall@ferc.gov
Related Files:
Notice [PDF]
Notice of Agenda and Procedures [PDF]
Mukerji, New York ISO [PDF]
Cohen and Yu, ABB [PDF]
Hogan, Harvard [PDF]
Gisin and David, PowerGEM - Practical Security [PDF]
Gisin and Gu, PowerGEM, PJM Perfect Dispatach [PDF]
Gregory and Bloom, IBM [PDF]
Vazacopoulos, FICO - Part I [PDF]
Vazacopoulos, FICO - Part II [PDF]
Zhao, Zheng, Litvinov, ISO New England [PDF]
Waight, Siemens and Jayantilal, Areva T&D [PDF]
Gribik and Zhang, Midwest ISO [PDF]
Stern, Yan, Luh, Southern California Edison [PDF]
Ela, NREL [PDF]
Zavala, Constanatinesu, Anitescu, Argonne National Laboratory [PDF]
Ott, PJM [PDF]
Rothleder, California ISO [PDF]
Koc, IBM [PDF]
Botterud, Argonne National Laboratory [PDF]
Botterud Paper, Argonne National Laboratory [PDF]
Shahidehpour, Illinois Institute of Technology [PDF]
Wang, Areva T&D [PDF]
Wang, Argonne National Laboratory [PDF]
Hedman, UC Berkeley [PDF]
Chatterjee, Midwest ISO [PDF]
Ruiz, Charles Rivers Associates [PDF]
Sun, Alstom [PDF]
Helman and Rothleder, CAISO [PDF]
Ilic, Carnegie Mellon [PDF]
Final Agenda with List of Attendees [PDF]
* All times are local
 
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